EPA-RCA: 6010 C: Trace elements in solution by ICP AES
Official Method Name
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Inductively Coupled Plasma - Atomic Emission Spectroscopy (ICP-AES) |
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Current Revision
| Revision 3.0, November 2000 |
Media
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VARIOUS |
Instrumentation
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Inductively Coupled Plasma - Atomic Emission Spectroscopy |
Method Subcategory
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Inorganic |
Method Source
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Citation
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Brief Method Summary
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This method describes multi-elemental determinations by ICP-AES using sequential or simultaneous optical systems and axial or radial viewing of the plasma. The instrument measures characteristic emission spectra by optical spectrometry. Samples are nebulized and the resulting aerosol is transported to the plasma torch. Element-specific emission spectra are produced by a radio-frequency inductively coupled plasma. The spectra are dispersed by a grating spectrometer, and the intensities of the emission lines are monitored by photosensitive devices. |
Scope and Application
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Inductively coupled plasma-atomic emission spectrometry (ICP-AES) may be used to determine trace elements in solution. The method is applicable to all of the elements listed below. With the exception of groundwater samples, all aqueous and solid matrices require acid digestion prior to analysis. Groundwater samples that have been prefiltered and acidified will not need acid digestion. Samples which are not digested require either an internal standard or should be matrix-matched with the standards. If either option is used, instrument software should be programmed to correct for intensity differences of the internal standard between samples and standards. Refer to Chapter Three for the appropriate digestion procedures. |
Applicable Concentration Range
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None given. |
Interferences
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I. SPECTRAL INTERFERENCES: (1) Background emmission or stray light. (2) Spectral overlap of emissions. II. PHYSICAL INTERFERENCES: High viscosity or high particulate levels of sample can clog nebulizer. III. CHEMICAL INTERFERENCES: (1) Compound formation. (2) Ionization. (3) Solute-vaporization. IV. MEMORY INTERFERENCES: Carry-over from sample. |
Quality Control Requirements
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(see ch. 1), CB, MB, ICV, CCV, MSD |
Sample Handling
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See SW-846 Chapter Three for information. |
Maximum Holding Time
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See SW-846 Chapter Three for information. |
Relative Cost
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$201 to $400 |
Sample Preparation Methods
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